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Extended Self-Test Log Sector
Table 159 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in
the SMART self-test log, defined in 11.52.6 Self-Test Log Data Structure on page 293 shall also be included in the
Extended SMART self-test log with all 48-bit entries.
Description
Bytes
Offset
Self-test log data structure revision number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h
Descriptor entry 1
26
04h
Descriptor entry 2
26
1Eh
...
Descriptor entry 18
26
1D8h
Vendor specific
2
1F2h
Reserved
11
1F4h
Data structure checksum
1
1FFh
512
Table 159 Extended Self-Test Log Data Structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that
replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry
2, etc. All unused self-test descriptors shall be filled with zeros.
Self-Test Log Data Structure Revision Number
The value of this revision number shall be 01h.
Self-Test Descriptor Index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values
for the Self-test descriptor index are 0 to 18.
Extended Self-test Log Descriptor Entry
The content of the self-test descriptor entry is shown below.
Description
Bytes
Offset
Self-test number
1
00h
Self-test execution status
1
01h
Power-on life timestamp in hours
2
02h
Self-test failure check point
1
04h
Failing LBA (7:0)
1
05h
Failing LBA (15:8)
1
06h
Failing LBA (23:16)
1
07h
Failing LBA (31:24)
1
08h
Failing LBA (39:32)
1
09h
Failing LBA (47:40)
1
0Ah
Vendor specific
15
0Bh
26
Table 160 Extended Self-Test Log Descriptor Entry
202
Western Digital Ultrastar DC HC310 SATA Product Manual