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State field contains a value indicating the device state when command was issued to the device.
Value
State
x0h
Unknown
x1h
Sleep
x2h
Standby (If the EPC feature set is enabled, Standby is standby_y or standby_z)
x3h
Active/Idle
(If the EPC feature set is enabled, Active/Idle is idle_a or idle_b or idle_c)
x4h
SMART Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note: The value of x is vendor specific.
Self-Test Log Data Structure
The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data
structures follow the ATA/ATAPI-7 specifications for byte ordering.
Description
Bytes
Offset
Data structure revision
2
00h
Self-test number
1
n*18h+02h
Self-test execution status
1
n*18h+03h
Life time power on hours
2
n*18h+04h
Self-test failure check point
1
n*18h+06h
LBA of first failure
4
n*18h+07h
Vendor specific
15
n*18h+0Bh
…
Vendor specific
2
1Fah
Self-test index
1
1FCh
Reserved
2
1FDh
Data structure checksum
1
1FFh
512
Note: n is 0 through 20
Table 242 Self-Test Log Data Structure
The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes
long and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors have been recorded, the oldest descriptor will be overwritten with new descriptor.
Self-test index points the most recent descriptor. When there is no descriptor the value is 0. When there is
descriptor(s) the value is 1 through 21.
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Western Digital Ultrastar DC HC310 SATA Product Manual