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12.21.4 Extended SMART Self-Test log (log page 07h)
Table 136 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in
the SMART self-test log, defined in Section 12.55.4.6 shall also be included in the Extended SMART self-test log with
all 48-bit entries.
Table 136 Extended Self-test log data structure
Description
Bytes
Offset
Self-test log data structure revision number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h
Descriptor entry 1
26
04h
Descriptor entry 2
26
1Eh
...
Descriptor entry 18
26
1D8h
Vendor specific
2
1F2h
Reserved
11
1F4h
Data structure checksum
1
1FFh
512
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that
replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry
2, etc. All unused self-test descriptors shall be filled with zeros.
12.21.4.1 Self-test log data structure revision number
The value of this revision number shall be 01h.
12.21.4.2 Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values for
the Self-test descriptor index are 0 to 18.
205
Hard Disk Drive Specification