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12.55.4.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
ATA/ATAPI-7 specifications for byte ordering.
Table 240 Selective self-test log data structure
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12h
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W
Ending LBA for test span 5
8
4Ah
R/W
Reserved
256
52h
Reserved
Vendor specific
154
152h
Vendor specific
Current LBA under test
8
1Ech
Read
Current span under test
2
1F4h
Read
Feature flags
2
1F6h
R/W
Vendor specific
4
1F8h
Vendor specific
Selective self-test pending time
2
1FCh
R/W
Reserved
1
1Feh
Reserved
Data structure checksum
1
1FFh
R/W
512
12.55.4.8 Feature flags
The Feature flags define the features of Selective self-test to be executed.
Table 241 Selective self-test feature flags
Bit
Description
0
Vendor specific
1
When set to one, perform off-line scan after selective test.
2
Vendor specific
3
When set to one, off-line scan after selective test is pending.
4
When set to one, off-line scan after selective test is active.
5-15
Reserved.
320
Hard Disk Drive Specification